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Hierarchical extraction of 3D interconnect capacitances in large regular VLSI structures
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Authors:
A. J. van Genderen
Department of Electrical Engineering, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands
N. P. van der Meijs
Department of Electrical Engineering, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands
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ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
IEEE Computer Society Press
Los Alamitos, CA
, USA
©1993
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ISBN:0-8186-4490-7
1993 Article
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