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Effects of delay models on peak power estimation of VLSI sequential circuits
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Authors:
Michael S. Hsiao
Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ
Elizabeth M. Rudnick
Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL
Janak H. Patel
Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL
Published in:
· Proceeding
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Pages 45-51
IEEE Computer Society
Washington, DC
, USA
©1997
table of contents
ISBN:0-8186-8200-0
1997 Article
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· Downloads (cumulative): 170
· Citation Count: 15
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Tags:
benchmarks
design
experimentation
measurement
peak power, variable delay, sustainable power, n-cycle power, genetic optimization
performance
sequential circuits
standardization
theory
vlsi
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