Test generation for comprehensive testing of linear analog circuits using transient response sampling

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Authors: Pramodchandran N. Variyam School of Electrical Engineering, Georgia Institute of Technology, Atlanta, Georgia
Abhijit Chatterjee School of Electrical Engineering, Georgia Institute of Technology, Atlanta, Georgia
Published in:
· Proceeding
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Pages 382-385
IEEE Computer Society Washington, DC, USA ©1997
table of contents ISBN:0-8186-8200-0
Test generation for comprehensive testing of linear analog circuits using transient response sampling 1997 Article
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