Fault simulation of interconnect opens in digital CMOS circuits

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Author: Haluk Konuk California Design Center-ICBD, Hewlett-Packard Company
Published in:
· Proceeding
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Pages 548-554
IEEE Computer Society Washington, DC, USA ©1997
table of contents ISBN:0-8186-8200-0
Fault simulation of interconnect opens in digital CMOS circuits 1997 Article
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