An efficient statistical analysis methodology and its application to high-density DRAMs

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Authors: Sang-Hoon Lee Semiconductor R & D Center, Samsung Electronics Co., Ltd., San #24 Nongseo-Ri, Kiheung-Eup, Yongin-Si, Kyungki-Do, Korea
Chang-Hoon Choi
Jeong-Taek Kong
Wong-Seong Lee
Jei-Hwan Yoo Semiconductor R & D Center, Samsung Electronics Co., Ltd., San #24 Nongseo-Ri, Kiheung-Eup, Yongin-Si, Kyungki-Do, Korea
An efficient statistical analysis methodology and its application to high-density DRAMs 1997 Article
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ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Pages 678-683
IEEE Computer Society Washington, DC, USA ©1997
table of contents ISBN:0-8186-8200-0

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