Providing Root of Trust for ARM TrustZone using On-Chip SRAM
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Authors:
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Shijun Zhao
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TCA Laboratory, ISCAS, Beijing, China
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Qianying Zhang
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TCA Laboratory, ISCAS, Beijing, China
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Guangyao Hu
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Beijing Vion Technology, Inc, Beijing, China
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Yu Qin
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TCA Laboratory, ISCAS, Beijing, China
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Dengguo Feng
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TCA Laboratory, ISCAS, Beijing, China
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2014 Article
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Bibliometrics
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Published in:

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TrustED '14 Proceedings of the 4th International Workshop on Trustworthy Embedded Devices
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Pages 25-36
ACM New York, NY, USA ©2014
table of contents
ISBN: 978-1-4503-3149-4
doi>10.1145/2666141.2666145
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