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Tools and methodology for RF IC design
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Authors:
Al Dunlop
Bell Laboratories, Murray Hill, NJ
Alper Demir
Bell Laboratories, Murray Hill, NJ
Peter Feldmann
Bell Laboratories, Murray Hill, NJ
Sharad Kapur
Bell Laboratories, Murray Hill, NJ
David Long
Bell Laboratories, Murray Hill, NJ
Robert Melville
Bell Laboratories, Murray Hill, NJ
Jaijeet Roychowdhury
Bell Laboratories, Murray Hill, NJ
1998 Article
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Published in:
· Proceeding
DAC '98 Proceedings of the 35th annual Design Automation Conference
Pages 414-420
ACM
New York, NY
, USA
©1998
table of contents
ISBN:0-89791-964-5
doi>
10.1145/277044.277155
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custom sizing, migration, timing optimazation
design
general
measurement
performance
theory
types and design styles
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