Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits

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Authors: Vamsi Boppana Fujitsu Laboratories of America, Inc., 595 Lawrence Expressway, Sunnyvale, CA
W. Kent Fuchs School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN
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· Proceeding
ICCAD '98 Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Pages 147-154
ACM New York, NY, USA ©1998
table of contents ISBN:1-58113-008-2 doi>10.1145/288548.288593
Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits Published by ACM 1998 Article
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