Test set compaction algorithms for combinational circuits

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Authors: Ilker Hamzaoglu Center for Reliable & High-Performance Computing, University of Illinois, Urbana, IL
Janak H. Patel Center for Reliable & High-Performance Computing, University of Illinois, Urbana, IL
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· Proceeding
ICCAD '98 Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Pages 283-289
ACM New York, NY, USA ©1998
table of contents ISBN:1-58113-008-2 doi>10.1145/288548.288615
Test set compaction algorithms for combinational circuits Published by ACM 1998 Article
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