SIGN IN
SIGN UP
Matching and aligning features in overlayed coverages
Full Text:
PDF
Buy this Article
Authors:
J. Mark Ware
School of Computing, University of Glamorgan, Pontypridd, CF371DL, Wales, UK
Christopher B. Jones
School of Computing, University of Glamorgan, Pontypridd, CF371DL, Wales, UK
Published in:
· Proceeding
GIS '98
Proceedings of the 6th ACM international symposium on Advances in geographic information systems
Pages 28-33
ACM
New York, NY
, USA
©1998
table of contents
ISBN:1-58113-115-1
doi>
10.1145/288692.288699
1998 Article
Bibliometrics
· Downloads (6 Weeks): 1
· Downloads (12 Months): 4
· Downloads (cumulative): 363
· Citation Count: 6
Tools and Resources
Buy this Article
Request Permissions
TOC Service:
Email
RSS
Save to Binder
Export Formats:
BibTeX
EndNote
ACM Ref
Share:
|
Tags:
algorithms
algorithms
change detection
conflation
equivalence testing
geometric overlay
languages
locational error
pattern matching
reliability
spatial databases and gis
Feedback
|
Switch to
single page view
(no tabs)
**Javascript is not enabled and is required for the "tabbed view" or switch to the
single page view
**
Powered by
The ACM Guide to Computing Literature
All Tags
Export Formats
Save to Binder