Lessons from BMIR-J2: a test collection for Japanese IR systems

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Authors: Tsuyoshi Kitani Laboratory for Information Technology, NTT Data Corporation
Yasushi Ogawa Ricoh
Tetsuya Ishikawa ULIS
Haruo Kimoto NTT
Ikuo Keshi SHARP
Jun Toyoura Mitsubishi Electric
Toshikazu Fukushima NEC
Kunio Matsui Fujitsu Laboratories
Yoshihiro Ueda Fuji Xerox
Tetsuya Sakai Toshiba
Takenobu Tokunaga Tokyo Institute of Technology
Hiroshi Tsuruoka ERI, Univ of Tokyo
Hidekazu Nakawatase NTT
Teru Agata Keio Univ.
Lessons from BMIR-J2: a test collection for Japanese IR systems Published by ACM 1998 Article
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· Proceeding
SIGIR '98 Proceedings of the 21st annual international ACM SIGIR conference on Research and development in information retrieval
Pages 345-346
ACM New York, NY, USA ©1998
table of contents ISBN:1-58113-015-5 doi>10.1145/290941.291033

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