EMI-noise analysis under ASIC design environment

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Authors: Sachio Hayashi DA Development Dept., Semiconductor DA & Test Engineering Center, Toshiba Corporation
Masaaki Yamada DA Development Dept., Semiconductor DA & Test Engineering Center, Toshiba Corporation
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· Proceeding
ISPD '99 Proceedings of the 1999 international symposium on Physical design
Pages 16-21
ACM New York, NY, USA ©1999
table of contents ISBN:1-58113-089-9 doi>10.1145/299996.300009
EMI-noise analysis under ASIC design environment Published by ACM 1999 Article
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