Portable parallel test generation for sequential circuits

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Authors: Balkrishna Ramkumar Dept. of Electrical & Computer Engg., University of Iowa, Iowa City, Iowa
Prithviraj Banerjee Center for Reliable & High-Perf. Computing, University of Illinois, Urbana, IL
Published in:
· Proceeding
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Pages 220-223
IEEE Computer Society Press Los Alamitos, CA, USA ©1992
table of contents ISBN:0-89791-540-2
Portable parallel test generation for sequential circuits 1992 Article
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· Citation Count: 4


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