An optimal probe testing algorthm for the connectivity verification of MCM substrates

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Authors:	So-Zen Yao	CSE Department, Mail Code 0114, University of California, San Diego, La Jolla, CA
	Nan-Chi Chou	CSE Department, Mail Code 0114, University of California, San Diego, La Jolla, CA
	Chung-Kuan Cheng	CSE Department, Mail Code 0114, University of California, San Diego, La Jolla, CA
	T. C. Hu	CSE Department, Mail Code 0114, University of California, San Diego, La Jolla, CA

	1992 Article
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ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design

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