COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits

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Authors: Lakshmi N. Reddy Dept. of Electrical & Computer Engg., The University of Iowa, Iowa City, IA
Irith Pomeranz
Sudhakar M. Reddy
Published in:
· Proceeding
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Pages 568-574
IEEE Computer Society Press Los Alamitos, CA, USA ©1992
table of contents ISBN:0-89791-540-2
COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits 1992 Article
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