Simulation and sensitivity of linear analog circuits under parameter variations by Robust interval analysis

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Authors: C.-J. Richard Shi University of Washington
Michael W. Tian University of Iowa
Published in:
· Journal
ACM Transactions on Design Automation of Electronic Systems (TODAES) TODAES Homepage archive
Volume 4 Issue 3, July 1999
Pages 280 - 312
ACM New York, NY, USA
table of contents doi>10.1145/315773.315780
Simulation and sensitivity of linear analog circuits under parameter variations by Robust interval analysis Published by ACM 1999 Article
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