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Yield analysis modeling

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Authors: Steve Perry NCA Corporation, 3250 Jay Street, Santa Clara, CA
Mike Mitchell Honeywell, SSED, 12001 State Highway 55, Plymouth, MN
D. Pilling NCA Corporation, 3250 Jay Street, Santa Clara, CA
Published in:
· Proceeding
DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference
ACM New York, NY, USA ©1985
table of contents ISBN:0-8186-0635-5 doi>10.1145/317825.317922
Yield analysis modeling Published by ACM 1985 Article
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· Citation Count: 0


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