Yield analysis modeling

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Authors: Steve Perry NCA Corporation, 3250 Jay Street, Santa Clara, CA
Mike Mitchell Honeywell, SSED, 12001 State Highway 55, Plymouth, MN
D. Pilling NCA Corporation, 3250 Jay Street, Santa Clara, CA
Published in:
· Proceeding
DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference
Pages 425-428
IEEE Press Piscataway, NJ, USA ©1985
table of contents ISBN:0-8186-0635-5
Yield analysis modeling 1985 Article
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