Optimal order of the VLSI IC testing sequence

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Author: Wojciech Maly Department of Electrical and Computer Engineering, Carnegie-Mellon University, Pittsburgh, Pennsylvania
Published in:
· Proceeding
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
Pages 560-566
IEEE Press Piscataway, NJ, USA ©1986
table of contents ISBN:0-8186-0702-5
Optimal order of the VLSI IC testing sequence 1986 Article
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