Sensitivity analysis via likelihood ratios

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Authors: Martin I. Reiman AT&T Bell Laboratories, Murray Hill, New Jersey
Alan Weiss AT&T Bell Laboratories, Murray Hill, New Jersey
Published in:
· Proceeding
WSC '86 Proceedings of the 18th conference on Winter simulation
Pages 285-289
ACM New York, NY, USA ©1986
table of contents ISBN:0-911801-11-1 doi>10.1145/318242.318450
Sensitivity analysis via likelihood ratios Published by ACM 1986 Article
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· Citation Count: 18


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