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ClariNet: a noise analysis tool for deep submicron design
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Authors:
Rafi Levy
Motorola Semiconductor Israel Ltd. Tel Aviv, Israel
David Blaauw
Motorola Inc. Austin, TX
Gabi Braca
Motorola Semiconductor Israel Ltd. Tel Aviv, Israel
Aurobindo Dasgupta
Motorola Inc. Austin, TX
Amir Grinshpon
Motorola Semiconductor Israel Ltd. Tel Aviv, Israel
Chanlee Oh
Motorola Inc. Austin, TX
Boaz Orshav
Motorola Inc. Austin, TX
Supamas Sirichotiyakul
Motorola Inc. Austin, TX
Vladimir Zolotov
Motorola Inc. Austin, TX
2000 Article
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Published in:
· Proceeding
DAC '00
Proceedings of the 37th Annual Design Automation Conference
Pages 233-238
ACM
New York, NY
, USA
©2000
table of contents
ISBN:1-58113-187-9
doi>
10.1145/337292.337400
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design
interconnection architectures
measurement
performance
reliability
theory
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