Functional Testing of Semiconductor Random Access Memories

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Authors: Magdy S. Abadir Department of Electrical Engineering, University of Southern California, Los Angeles, California
Hassan K. Reghbati Computing Science Department, Simon Fraser University, Burnaby, British Columbia, Canada V5A 1S6
Published in:
· Journal
ACM Computing Surveys (CSUR) Surveys Homepage archive
Volume 15 Issue 3, Sept. 1983
Pages 175-198
ACM New York, NY, USA
table of contents doi>10.1145/356914.356916
Functional Testing of Semiconductor Random Access Memories Published by ACM 1983 Article
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· Citation Count: 30


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