Diagnosis for scan-based BIST: reaching deep into the signatures

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Authors: I. Bayraktaroglu Computer Science & Engineering Department, University of California, San Diego, La Jolla, CA
A. Orailoglu Computer Science & Engineering Department, University of California, San Diego, La Jolla, CA
Published in:
· Proceeding
DATE '01 Proceedings of the conference on Design, automation and test in Europe
Pages 102-111
IEEE Press Piscataway, NJ, USA ©2001
table of contents ISBN:0-7695-0993-2
Diagnosis for scan-based BIST: reaching deep into the signatures 2001 Article
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