Gate-level aged timing simulation methodology for hot-carrier reliability assurance

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Authors:	Yoshiyuki Kawakami	Matsushita Electric Industrial Co., Ltd., Osaka, 570-8501, Japan
	Jingkun Fang	BTA Technology, Inc., San Jose, CA
	Hirokazu Yonezawa	Matsushita Electric Industrial Co., Ltd., Osaka, 570-8501, Japan
	Nobufusa Iwanishi	Matsushita Electric Industrial Co., Ltd., Osaka, 570-8501, Japan
	Lifeng Wu	BTA Technology, Inc., San Jose, CA
	Alvin I-Hsien Chen	BTA Technology, Inc., San Jose, CA
	Norio Koike
	Ping Chen
	Chune-Sin Yeh	BTA Technology, Inc., San Jose, CA
	Zhihong Liu	BTA Technology, Inc., San Jose, CA

	2000 Article
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ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference

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