Correlation method of circuit-performance and technology fluctuations for improved design reliability

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Authors:	D. Miyawaki	Department of Electrical Engineering, Hiroshima University 1-4-1, Kagamiyama, Higashi-Hiroshima 739-8527, Japan
	S. Matsumoto	Department of Electrical Engineering, Hiroshima University 1-4-1, Kagamiyama, Higashi-Hiroshima 739-8527, Japan
	H. J. Mattausch	Research Center for Nanodevice and System, Hiroshima University 1-4-1, Kagamiyama, Higashi-Hiroshima 739-8527, Japan
	S. Ooshiro	Department of Electrical Engineering, Hiroshima University 1-4-1, Kagamiyama, Higashi-Hiroshima 739-8527, Japan
	M. Suetake	Department of Electrical Engineering, Hiroshima University 1-4-1, Kagamiyama, Higashi-Hiroshima 739-8527, Japan
	M. Miura-Mattausch	Department of Electrical Engineering, Hiroshima University 1-4-1, Kagamiyama, Higashi-Hiroshima 739-8527, Japan
	S. Kumashiro	Semiconductor Technology Academic, Research Center, 6-16-10, Shimbashi, Minato-ku, Tokyo, 105-0004, Japan
	T. Yamaguchi	Semiconductor Technology Academic, Research Center, 6-16-10, Shimbashi, Minato-ku, Tokyo, 105-0004, Japan
	K. Yamashita	Semiconductor Technology Academic, Research Center, 6-16-10, Shimbashi, Minato-ku, Tokyo, 105-0004, Japan
	N. Nakayama	Semiconductor Technology Academic, Research Center, 6-16-10, Shimbashi, Minato-ku, Tokyo, 105-0004, Japan

	2001 Article
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ASP-DAC '01 Proceedings of the 2001 Asia and South Pacific Design Automation Conference

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