Semi-formal test generation with genevieve

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Authors: Julia Dushina STMicroelectronics, 1000 Aztec West, Bristol BS32 4SQ, UK
Mike Benjamin STMicroelectronics, 1000 Aztec West, Bristol BS32 4SQ, UK
Daniel Geist IBM Corp, MATAM, Haifa, Israel
Published in:
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· Proceeding
DAC '01 Proceedings of the 38th annual Design Automation Conference
Pages 617-622
ACM New York, NY, USA ©2001
table of contents ISBN:1-58113-297-2 doi>10.1145/378239.379035
Semi-formal test generation with genevieve Published by ACM 2001 Article
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