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Authors:
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W. Lee
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VHSIC Test Systems, SENTRY Schlumberger, 1601 Technology Drive, San Jose, CA
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G. Liu
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VHSIC Test Systems, SENTRY Schlumberger, 1601 Technology Drive, San Jose, CA
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K. Peterson
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Master's akgree in EECS at the Massachusetts Institute of Technology
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| Published in: |
| · Proceeding |
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DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
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ACM New York, NY, USA ©1987
table of contents
ISBN:0-8186-0781-5
doi>10.1145/37888.37951
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1987 Article
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Bibliometrics
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· Downloads (6 Weeks): 2
· Downloads (12 Months): 7
· Citation Count: 2
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