Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs

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Authors: A. Keshavarzi Microprocessor Research Labs, Intel Corporation, Hillsboro, OR
S. Ma Microprocessor Research Labs, Intel Corporation, Hillsboro, OR
S. Narendra Microprocessor Research Labs, Intel Corporation, Hillsboro, OR
B. Bloechel Microprocessor Research Labs, Intel Corporation, Hillsboro, OR
K. Mistry Portland Technology Development, Intel Corporation, Hillsboro, OR
T. Ghani Portland Technology Development, Intel Corporation, Hillsboro, OR
S. Borkar Microprocessor Research Labs, Intel Corporation, Hillsboro, OR
V. De Microprocessor Research Labs, Intel Corporation, Hillsboro, OR
Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs Published by ACM 2001 Article
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ISLPED '01 Proceedings of the 2001 international symposium on Low power electronics and design
Pages 207-212
ACM New York, NY, USA ©2001
table of contents ISBN:1-58113-371-5 doi>10.1145/383082.383135

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