Embedded software-based self-testing for SoC design

doi:10.1145/513918.514010

Embedded software-based self-testing for SoC design

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Authors:	A. Krstic	University of California, Santa Barbara, CA
	W. C. Lai	University of California, Santa Barbara, CA
	K. T. Cheng	University of California, Santa Barbara, CA
	L. Chen	University of California, San Diego, CA
	S. Dey	University of California, San Diego, CA

	2002 Article
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	· Proceeding
	DAC '02 Proceedings of the 39th annual Design Automation Conference
	Pages 355-360 ACM New York, NY, USA ©2002 table of contents ISBN:1-58113-461-4 doi>10.1145/513918.514010

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Tags: algorithms functional test microprocessor test performance reliability reliability, testing, and fault-tolerance soc test vlsi test

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