Enhancing test efficiency for delay fault testing using multiple-clocked schemes

doi:10.1145/513918.514013

Enhancing test efficiency for delay fault testing using multiple-clocked schemes

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Authors:	Jing-Jia Liou	UC-Santa Barbara
	Li-C. Wang	UC-Santa Barbara
	Kwang-Ting Cheng	UC-Santa Barbara
	Jennifer Dworak	Texas A&M University
	M. Ray Mercer	Texas A&M University
	Rohit Kapur	Synopsys Inc.
	Thomas W. Williams	Synopsys Inc.

	2002 Article
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· Downloads (6 Weeks): 1 · Downloads (12 Months): 13 · Downloads (cumulative): 180 · Citation Count: 2

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	· Proceeding
	DAC '02 Proceedings of the 39th annual Design Automation Conference
	Pages 371-374 ACM New York, NY, USA ©2002 table of contents ISBN:1-58113-461-4 doi>10.1145/513918.514013

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Tags: delay testing experimentation measurement reliability reliability, testing, and fault-tolerance statistical timing analysis transition fault model

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