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VeriCDF: a new verification methodology for charged device failures

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Authors: Jaesik Lee University of Illinois, Urbana, IL
Ki-Wook Kim Pluris Incorporation, Cupertino, CA
Sung-Mo Kang University of California, Santa Cruz, CA
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· Proceeding
DAC '02 Proceedings of the 39th annual Design Automation Conference
ACM New York, NY, USA ©2002
table of contents ISBN:1-58113-461-4 doi>10.1145/513918.514134
VeriCDF: a new verification methodology for charged device failures Published by ACM 2002 Article
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