Coverage directed test generation for functional verification using bayesian networks

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Authors: Shai Fine IBM Research Laboratory in Haifa, Haifa, Israel
Avi Ziv IBM Research Laboratory in Haifa, Haifa, Israel
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· Proceeding
DAC '03 Proceedings of the 40th annual Design Automation Conference
Pages 286-291
ACM New York, NY, USA ©2003
table of contents ISBN:1-58113-688-9 doi>10.1145/775832.775907
Coverage directed test generation for functional verification using bayesian networks Published by ACM 2003 Article
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