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On-chip interconnect-aware design and modeling methodology, based on high bandwidth transmission line devices
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Authors:
D. Goren
IBM Haifa Research and Development Labs, MATAM, Haifa, Israel
M. Zelikson
IBM Haifa Research and Development Labs, MATAM, Haifa, Israel
R. Gordin
IBM Haifa Research and Development Labs, MATAM, Haifa, Israel
I. A. Wagner
IBM Haifa Research and Development Labs, MATAM, Haifa, Israel
A. Barger
IBM Haifa Research and Development Labs, MATAM, Haifa, Israel
A. Amir
IBM Haifa Research and Development Labs, MATAM, Haifa, Israel
B. Livshitz
IBM Haifa Research and Development Labs, MATAM, Haifa, Israel
A. Sherman
IBM Haifa Research and Development Labs, MATAM, Haifa, Israel
Y. Tretiakov
IBM Design Automation Dept. Burlington, US
R. Groves
IBM SiGe Model Development, East Fishkill, US
J. Park
IBM SiGe Model Development, East Fishkill, US
D. Jordan
IBM Design Automation Dept. Burlington, US
S. Strang
IBM Design Automation Dept. Burlington, US
R. Singh
IBM Design Automation Dept. Burlington, US
C. Dickey
IBM Design Automation Dept. Burlington, US
D. Harame
IBM Design Automation Dept. Burlington, US
2003 Article
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Published in:
· Proceeding
DAC '03
Proceedings of the 40th annual Design Automation Conference
Pages 724-727
ACM
New York, NY
, USA
©2003
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ISBN:1-58113-688-9
doi>
10.1145/775832.776017
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design
design aids
interconnect
measurement
modeling
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