Randomness-efficient low degree tests and short PCPs via epsilon-biased sets

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Authors: Eli Ben-Sasson Harvard University and MIT, Cambridge, MA
Madhu Sudan Massachussettes Institute of Technology, Cambridge, MA
Salil Vadhan Harvard University, Cambridge, MA
Avi Wigderson Princeton, Princeton, NJ and the Hebrew University, Jerusalem
Randomness-efficient low degree tests and short PCPs via epsilon-biased sets Published by ACM 2003 Article
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· Proceeding
STOC '03 Proceedings of the thirty-fifth annual ACM symposium on Theory of computing
Pages 612-621
ACM New York, NY, USA ©2003
table of contents ISBN:1-58113-674-9 doi>10.1145/780542.780631

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