Selecting long atomic traces for high coverage

Full Text: PDFPDF Buy this ArticleBuy this Article
Authors: Roni Rosner Microprocessor Research Intel Labs (formerly MRL), Haifa, Israel
Micha Moffie Microprocessor Research Intel Labs (formerly MRL), Haifa, Israel
Yiannakis Sazeides University of Cyprus, Nicosia, Cyprus
Ronny Ronen Microprocessor Research Intel Labs (formerly MRL), Haifa, Israel
Selecting long atomic traces for high coverage Published by ACM 2003 Article
Bibliometrics Data  Bibliometrics
· Downloads (6 Weeks): 0
· Downloads (12 Months): 8
· Downloads (cumulative): 400
· Citation Count: 5

Published in:
Cover Image
 
· Proceeding
ICS '03 Proceedings of the 17th annual international conference on Supercomputing
Pages 2-11
ACM New York, NY, USA ©2003
table of contents ISBN:1-58113-733-8 doi>10.1145/782814.782818

Tools and Resources

Share:

|
feedback Feedback | Switch to single page view (no tabs)

Powered by The ACM Guide to Computing Literature


The ACM Digital Library is published by the Association for Computing Machinery. Copyright © 2013 ACM, Inc.
Terms of Usage   Privacy Policy   Code of Ethics   Contact Us

Useful downloads: Adobe Acrobat    QuickTime    Windows Media Player    Real Player
The ACM Guide to Computing Literature
All Tags
Export Formats
 
 
Save to Binder