On test data volume reduction for multiple scan chain designs

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Authors: Sudhakar M. Reddy University of Iowa, Iowa City, IA
Kohei Miyase Kyushu Institute of Technology, Iizuka Japan
Seiji Kajihara Kyushu Institute of Technology, Iizuka Japan
Irith Pomeranz Purdue University, West Lafayette, IN
On test data volume reduction for multiple scan chain designs Published by ACM 2003 Article
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ACM Transactions on Design Automation of Electronic Systems (TODAES) TODAES Homepage archive
Volume 8 Issue 4, October 2003
Pages 460 - 469
ACM New York, NY, USA
table of contents doi>10.1145/944027.944031

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