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Authors:
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A. El-Hoiydi
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Swiss Center for Electronics and Microtechnology (CSEM SA), Neuchâtel, Switzerland
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J.-D. Decotignie
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Swiss Center for Electronics and Microtechnology (CSEM SA), Neuchâtel, Switzerland
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C. Enz
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Swiss Center for Electronics and Microtechnology (CSEM SA), Neuchâtel, Switzerland
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E. Le Roux
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Swiss Center for Electronics and Microtechnology (CSEM SA), Neuchâtel, Switzerland
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