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Authors:
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Juan Arellano
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Instituto de Investigaclones Electrlcas, Apartado Postal 475, Cuernavaca, Morelos, 62000, Mexico
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Yalu Galicia
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Instituto de Investigaclones Electrlcas, Apartado Postal 475, Cuernavaca, Morelos, 62000, Mexico
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Edgar C. Ramirez Dominguez
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Instituto de Investigaclones Electrlcas, Apartado Postal 475, Cuernavaca, Morelos, 62000, Mexico
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| Published in: |
| · Proceeding |
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IEA/AIE '90 Proceedings of the 3rd international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 2
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Pages 707-715
ACM New York, NY, USA ©1990
table of contents
ISBN:0-89791-372-8
doi>10.1145/98894.98919
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