Characterization of logic circuit techniques for high leakage CMOS technologies

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Authors: Phillip Chin Columbia University, New York, NY
Charles A. Zukowski Columbia University, New York, NY
George D. Gristede IBM T.J. Watson Research Center, Yorktown Heights, NY
Stephen Kosonocky IBM T.J. Watson Research Center, Yorktown Heights, NY
Characterization of logic circuit techniques for high leakage CMOS technologies Published by ACM 2004 Article
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GLSVLSI '04 Proceedings of the 14th ACM Great Lakes symposium on VLSI
Pages 230-235
ACM New York, NY, USA ©2004
table of contents ISBN:1-58113-853-9 doi>10.1145/988952.989008

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