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Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations

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Authors: Imad A. Ferzli University of Toronto, Canada
Farid N. Najm University of Toronto, Canada
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· Proceeding
ICCAD '03 Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
IEEE Computer Society Washington, DC, USA ©2003
table of contents ISBN:1-58113-762-1
Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations 2003 Article
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