Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs

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Authors: Göran Jerke Robert Bosch GmbH, Reutlingen, Germany
Jens Lienig Dresden University of Technology, Dresden, Germany
Jürgen Scheible Robert Bosch GmbH, Reutlingen, Germany
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· Proceeding
DAC '04 Proceedings of the 41st annual Design Automation Conference
Pages 181-184
ACM New York, NY, USA ©2004
table of contents ISBN:1-58113-828-8 doi>10.1145/996566.996618
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs Published by ACM 2004 Article
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