Noise characterization of static CMOS gates

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Authors: Rouwaida Kanj University of Illinois at Urbana-Champaign
Timothy Lehner IBM Corporation, Hopewell Junction, NYIBM Corporation, Hopewell Junction, NY
Bhavna Agrawal IBM Corporation, Hopewell Junction, NY
Elyse Rosenbaum University of Illinois at Urbana-Champaign
Noise characterization of static CMOS gates Published by ACM 2004 Article
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· Proceeding
DAC '04 Proceedings of the 41st annual Design Automation Conference
Pages 888-893
ACM New York, NY, USA ©2004
table of contents ISBN:1-58113-828-8 doi>10.1145/996566.996803

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