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Authors:
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Y. Sirisathitkul
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School of Applied Statistics, National Institute of Development Adminstration, 118 Moo3, Sereethai Road, Khong-Chan, Bangkapi, Bangkok 10240, Thailand
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S. Auwatanamongkol
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School of Applied Statistics, National Institute of Development Adminstration, 118 Moo3, Sereethai Road, Khong-Chan, Bangkapi, Bangkok 10240, Thailand
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B. Uyyanonvara
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Department of Information Technology, Sirindhorn International Institute of Technology, Thammasart University, Bangkok, Thailand
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| Published in: |
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Pattern Recognition Letters
archive
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Volume 25 Issue 9, 2 July 2004
Pages 1025-1043
Elsevier Science Inc. New York, NY, USA
table of contents
doi>10.1016/j.patrec.2004.02.012
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2004 Article
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Bibliometrics
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· Citation Count: 8
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