research-article

Low-resolution DAC-driven linearity testing of higher resolution ADCs using polynomial fitting measurements

Authors:

Abhijit ChatterjeeAuthors Info & Claims

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Volume 21, Issue 3

Pages 454 - 464

https://doi.org/10.1109/TVLSI.2012.2190433

Published: 01 March 2013 Publication History

Abstract

A low-cost linearity test methodology for high-resolution analog-to-digital converters (ADCs) is presented in this paper. Linearity testing of ADCs requires high-precision digital-to-analog conversion (DAC) capability, commonly 3-bit higher resolution than the ADC under test. Further, a large number of ADC output data samples must be collected making conventional histogram testing impractical for high-resolution ADCs with 18-24 bit precision. In the proposed test methodology, two low-precision and low-cost DACs are used to generate a high-resolution ADC test stimulus. Significant reductions in test cost and test time are achieved by using low-cost instrumentation and by making fewer measurements than required for conventional histogram test. A least-squares-based polynomial fitting approach is used to determine the transfer function of the ADC under test. The generated transfer function is used to compute the non-linearity of the ADC accurately. No assumption is made regarding the linearity of the lower precision signal generators (DACs) used in the testing procedure. Software simulations and hardware experiments are performed to validate the proposed test methodology.

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Cited By

Guo XYan XMa SZhang XYan ZZhang AXu KHua LDu YWang HShu YHong WZhao YXu Y(2024)Wavelet decomposition and reconstruction-based INL method for testing high-precision ADCMicroelectronics Journal10.1016/j.mejo.2023.105945142:COnline publication date: 27-Feb-2024
https://dl.acm.org/doi/10.1016/j.mejo.2023.105945
Qin WSin SU SMartins R(2018)Quick and cost-efficient A/D converter static characterization using low-precision testing signalMicroelectronics Journal10.1016/j.mejo.2018.02.00174:C(86-93)Online publication date: 27-Dec-2018
https://dl.acm.org/doi/10.1016/j.mejo.2018.02.001
Li BWang YChen YLi HYang HFettweis GNebel W(2014)ICEProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616832(1-4)Online publication date: 24-Mar-2014
https://dl.acm.org/doi/10.5555/2616606.2616832

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Published In

cover image IEEE Transactions on Very Large Scale Integration (VLSI) Systems

IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 21, Issue 3

March 2013

210 pages

ISSN:1063-8210

Issue’s Table of Contents

Copyright © 2013.

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IEEE Educational Activities Department

United States

Publication History

Published: 01 March 2013

Accepted: 16 February 2012

Revised: 10 December 2011

Received: 11 July 2011

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Cited By

Guo XYan XMa SZhang XYan ZZhang AXu KHua LDu YWang HShu YHong WZhao YXu Y(2024)Wavelet decomposition and reconstruction-based INL method for testing high-precision ADCMicroelectronics Journal10.1016/j.mejo.2023.105945142:COnline publication date: 27-Feb-2024
https://dl.acm.org/doi/10.1016/j.mejo.2023.105945
Qin WSin SU SMartins R(2018)Quick and cost-efficient A/D converter static characterization using low-precision testing signalMicroelectronics Journal10.1016/j.mejo.2018.02.00174:C(86-93)Online publication date: 27-Dec-2018
https://dl.acm.org/doi/10.1016/j.mejo.2018.02.001
Li BWang YChen YLi HYang HFettweis GNebel W(2014)ICEProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616832(1-4)Online publication date: 24-Mar-2014
https://dl.acm.org/doi/10.5555/2616606.2616832

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