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A design approach for a microprogrammed control unit with built in self test

Published:01 December 1983Publication History
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Abstract

We present an architecture for concurrent testing of a microprogrammed control unit. This approach is compared with other control unit testing strategies. The advantages of this approach are: a) it allows testing of the control unit independent of the operational section, b) minimizes the hardcore, c) it is easily incorporated in microprogrammed control units, d) since it is concurrent, probability of detecting intertermittent errors is high, e) it is incorporated into the specification and therefore amenable for VLSI implementations.

References

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  • Published in

    cover image ACM SIGMICRO Newsletter
    ACM SIGMICRO Newsletter  Volume 14, Issue 4
    December 1983
    205 pages
    ISSN:1050-916X
    DOI:10.1145/1096419
    Issue’s Table of Contents

    Copyright © 1983 Authors

    Publisher

    Association for Computing Machinery

    New York, NY, United States

    Publication History

    • Published: 1 December 1983

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