
Index Terms
(auto-classified)Introduction: Special issue of the IEEE SUTC'06
Recommendations
Guest Editors' Introduction: The Status of IEEE Std 1500—Part 2
In this issue, IEEE Design and Test presents Part 2 of the status of IEEE Std 1500, with three articles concluding our double special issue.
Guest Editors' Introduction: The Status of IEEE Std 1500
The increased use of embedded predesigned reusable cores necessitates a core-based test strategy. The goal of IEEE Std 1500-2005 is to simplify reuse and facilitate interoperability for testing core-based system chips, especially if they contain cores ...






Comments