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Towards Large-Scale Super Resolution Datasets via Learned Downsampling of Ray-Traced Renderings

Published:06 August 2021Publication History

ABSTRACT

Delivering high resolution content is a challenge in the film and games industries due to the cost of photorealistic ray-traced rendering. Image upscaling techniques are commonly used to obtain a high resolution result from a low resolution render. Recently, deep learned upscaling has started to make an impact in production settings, synthesizing sharper and more detailed imagery than previous methods. The quality of a super resolution model depends on the size of its dataset, which can be expensive to generate at scale due to the large number of ray-traced pairs of renders required. In this report, we discuss our experiments training an additional neural network to learn the degradation operator, which can be used to rapidly generate low resolution images from existing high resolution renders. Our testing on production scenes shows that super resolution networks trained with a large synthetic dataset produce fewer artifacts and better reconstruction quality than networks trained on a smaller rendered dataset alone, and compare favorably to recent state of the art blind synthetic data techniques.

References

  1. Victor Cornillere, Abdelaziz Djelouah, Wang Yifan, Olga Sorkine-Hornung, and Christopher Schroers. 2019. Blind image super-resolution with spatially variant degradations. ACM Transactions on Graphics (TOG) 38, 6 (2019), 1–13.Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. Vaibhav Vavilala and Mark Meyer. 2020. Deep Learned Super Resolution for Feature Film Production. In ACM SIGGRAPH 2020 Talks(SIGGRAPH ’20). Association for Computing Machinery, New York, NY, USA, Article 41, 2 pages. https://doi.org/10.1145/3388767.3407334Google ScholarGoogle Scholar
  3. Yifan Wang, Federico Perazzi, Brian McWilliams, Alexander Sorkine-Hornung, Olga Sorkine-Hornung, and Christopher Schroers. 2018. A fully progressive approach to single-image super-resolution. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops. 864–873.Google ScholarGoogle ScholarCross RefCross Ref

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    • Published in

      cover image ACM Conferences
      SIGGRAPH '21: ACM SIGGRAPH 2021 Talks
      July 2021
      116 pages
      ISBN:9781450383738
      DOI:10.1145/3450623

      Copyright © 2021 Owner/Author

      Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

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      Association for Computing Machinery

      New York, NY, United States

      Publication History

      • Published: 6 August 2021

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      • invited-talk
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      • Refereed limited

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      Overall Acceptance Rate1,822of8,601submissions,21%
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