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Unbiased Emission and Scattering Importance Sampling For Heterogeneous Volumes

Published:06 August 2021Publication History

ABSTRACT

We present two new distance-sampling methods for production volume path tracing. We extend the null-collision integral formulation to efficiently gather heterogeneous volumetric emission, achieving higher-quality results. Additionally, we propose a tabulation-based approach to importance sample volumetric in-scattering through a spatial guiding data structure. Our methods improve the sampling efficiency for scenarios where low-order heterogeneous scattering dominates, which tends to cause high variance renderings with existing null-collision methods.

References

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    • Published in

      cover image ACM Conferences
      SIGGRAPH '21: ACM SIGGRAPH 2021 Talks
      July 2021
      116 pages
      ISBN:9781450383738
      DOI:10.1145/3450623

      Copyright © 2021 Owner/Author

      Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

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      Association for Computing Machinery

      New York, NY, United States

      Publication History

      • Published: 6 August 2021

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      Overall Acceptance Rate1,822of8,601submissions,21%
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